DocumentCode
2217265
Title
Modeling and simulation of real defects using fuzzy logic
Author
Attarha, Amir ; Nourani, Mehrdad ; Lucas, Caro
Author_Institution
The Univ. of Texas
fYear
2000
fDate
2000
Firstpage
631
Lastpage
636
Keywords
Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fabrication; Fault detection; Fuzzy logic; Semiconductor device modeling; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN
1-58113-187-9
Type
conf
DOI
10.1109/DAC.2000.855389
Filename
855389
Link To Document