Title :
Uncover the diffusion mechanism of atoms during electromigration test using non-stationary noise analysis
Author :
Lim, Shin Yeh ; Tan, Cher Ming ; Krishnamachar, Prasad ; Zhang, Dao Hua
Author_Institution :
Sch. of Electron. & Electr. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
A non-stationary signal processing method - smoothed pseudo Wigner-Ville distribution (SPWD) is employed to investigate the frequency exponent variation and frequency characteristic trend of the electromigration noise. Comparison of the results by both the stationary signal processing tool-Fourier transform and SPWD-will be presented. It is found that the non-stationary analysis is more suitable in interpreting the noise of highly dynamic process like electromigration.
Keywords :
electromigration; integrated circuit interconnections; integrated circuit noise; integrated circuit reliability; atom diffusion mechanism; dynamic process; electromigration noise; electromigration test; frequency exponent; nonstationary noise analysis; signal processing; smoothed pseudo Wigner-Ville distribution; Atomic measurements; Electromigration; Fourier transforms; Frequency estimation; Noise measurement; Signal analysis; Signal processing; Testing; Time frequency analysis; Ultra large scale integration;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Print_ISBN :
0-7803-6520-8
DOI :
10.1109/ICSICT.2001.982050
