• DocumentCode
    2217813
  • Title

    Numerical evaluation of Near-Field to Far-Field transformation robustness for EMC

  • Author

    Radchenko, Andriy ; Zhang, Ji ; Kam, Keong ; Pommerenke, David

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2012
  • fDate
    6-10 Aug. 2012
  • Firstpage
    605
  • Lastpage
    611
  • Abstract
    Near-Field (NF) to Far-Field (FF) transformation techniques are widely used for antenna radiation problems. To perform a NF to FF or a NF to NF transformation for EMC applications, the large frequency range, and a weak signals will require data in the reactive near field. In principle, the transformation can be performed if all sources are confined in the scanned area using Huygens´ Principle, which requires knowledge of the exact phase and magnitude data of measured fields. In reality, this cannot be achieved, due to uncertainties in the field probe measurements, presence of active and passive cables and limited scan areas. Thus, it is attempted to perform a transformation based on an incomplete and uncertain data set. Results of a numerical simulation tool usage for NF to FF transformation based on NF-Scanning system measured data are demonstrated.
  • Keywords
    antenna radiation patterns; cables (electric); electromagnetic compatibility; numerical analysis; EMC; FF transformation techniques; Huygens principle; NF transformation techniques; NF-scanning system; active cables; antenna radiation problems; far-field transformation technique; field probe measurements; near-field transformation technique; numerical evaluation; numerical simulation; passive cables; Dynamic range; Electric fields; Electromagnetic compatibility; Integrated circuits; Magnetic field measurement; Noise measurement; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4673-2061-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2012.6351692
  • Filename
    6351692