DocumentCode
2217813
Title
Numerical evaluation of Near-Field to Far-Field transformation robustness for EMC
Author
Radchenko, Andriy ; Zhang, Ji ; Kam, Keong ; Pommerenke, David
Author_Institution
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear
2012
fDate
6-10 Aug. 2012
Firstpage
605
Lastpage
611
Abstract
Near-Field (NF) to Far-Field (FF) transformation techniques are widely used for antenna radiation problems. To perform a NF to FF or a NF to NF transformation for EMC applications, the large frequency range, and a weak signals will require data in the reactive near field. In principle, the transformation can be performed if all sources are confined in the scanned area using Huygens´ Principle, which requires knowledge of the exact phase and magnitude data of measured fields. In reality, this cannot be achieved, due to uncertainties in the field probe measurements, presence of active and passive cables and limited scan areas. Thus, it is attempted to perform a transformation based on an incomplete and uncertain data set. Results of a numerical simulation tool usage for NF to FF transformation based on NF-Scanning system measured data are demonstrated.
Keywords
antenna radiation patterns; cables (electric); electromagnetic compatibility; numerical analysis; EMC; FF transformation techniques; Huygens principle; NF transformation techniques; NF-scanning system; active cables; antenna radiation problems; far-field transformation technique; field probe measurements; near-field transformation technique; numerical evaluation; numerical simulation; passive cables; Dynamic range; Electric fields; Electromagnetic compatibility; Integrated circuits; Magnetic field measurement; Noise measurement; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location
Pittsburgh, PA
ISSN
2158-110X
Print_ISBN
978-1-4673-2061-0
Type
conf
DOI
10.1109/ISEMC.2012.6351692
Filename
6351692
Link To Document