A unified method for determining characteristic parameters of different reliability statistics

Author

Mu, Fuchen ; Tan, Changhua ; Xu, Mingzhen

Author_Institution

Inst. of Microelectron., Peking Univ., Beijing, China

Volume

2

fYear

2001

fDate

22-25 Oct. 2001

Firstpage

978

Abstract

By using proportional difference operator (PDO), a unified method Proportional Difference Estimate (PDE) method, for direct estimation of the characteristic parameters of exponential, normal, log-normal, and Weibull distributions was developed from their cumulative distribution functions. These distributions are widely used in microelectronics reliability study. Consequently, this method will be very useful in microelectronics.

Keywords

Weibull distribution; exponential distribution; log normal distribution; normal distribution; parameter estimation; reliability theory; Weibull distribution; characteristic parameters; cumulative distribution function; exponential distribution; log-normal distribution; microelectronics reliability statistics; normal distribution; proportional difference estimate; proportional difference operator; Distribution functions; Failure analysis; Maximum likelihood estimation; Microelectronics; Probability distribution; Shape; Spectroscopy; Statistical distributions; Statistics; Weibull distribution;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on

Print_ISBN

0-7803-6520-8

Type

conf

DOI

10.1109/ICSICT.2001.982059

Filename

982059