Title :
A unified method for determining characteristic parameters of different reliability statistics
Author :
Mu, Fuchen ; Tan, Changhua ; Xu, Mingzhen
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
Abstract :
By using proportional difference operator (PDO), a unified method Proportional Difference Estimate (PDE) method, for direct estimation of the characteristic parameters of exponential, normal, log-normal, and Weibull distributions was developed from their cumulative distribution functions. These distributions are widely used in microelectronics reliability study. Consequently, this method will be very useful in microelectronics.
Keywords :
Weibull distribution; exponential distribution; log normal distribution; normal distribution; parameter estimation; reliability theory; Weibull distribution; characteristic parameters; cumulative distribution function; exponential distribution; log-normal distribution; microelectronics reliability statistics; normal distribution; proportional difference estimate; proportional difference operator; Distribution functions; Failure analysis; Maximum likelihood estimation; Microelectronics; Probability distribution; Shape; Spectroscopy; Statistical distributions; Statistics; Weibull distribution;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Print_ISBN :
0-7803-6520-8
DOI :
10.1109/ICSICT.2001.982059
