DocumentCode
2217843
Title
Closing the gap between analog and digital
Author
Saab, Khaled ; Hamida, N.B. ; Kaminska, Bozena
Author_Institution
Fluence Technology Inc.
fYear
2000
fDate
2000
Firstpage
774
Lastpage
779
Keywords
Analog circuits; Automatic testing; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Integrated circuit testing; Permission; Signal generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN
1-58113-187-9
Type
conf
DOI
10.1109/DAC.2000.855418
Filename
855418
Link To Document