Title :
Universal fault simulation using fault tuples
Author :
Dwarakanath, Kumar N. ; Blanton, R.D.
Author_Institution :
Carnegie Mellon University
Keywords :
Automatic test pattern generation; Clocks; Error correction; Fault detection; Performance evaluation; Testing;
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
DOI :
10.1109/DAC.2000.855420
