• DocumentCode
    2217937
  • Title

    Activity Analysis Using Spatio-Temporal Trajectory Volumes in Surveillance Applications

  • Author

    Janoos, Firdaus ; Singh, Shantanu ; Irfanoglu, Okan ; Machiraju, Raghu ; Parent, Richard

  • Author_Institution
    Ohio State Univ., Columbus
  • fYear
    2007
  • fDate
    Oct. 30 2007-Nov. 1 2007
  • Firstpage
    3
  • Lastpage
    10
  • Abstract
    In this paper, we present a system to analyze activities and detect anomalies in a surveillance application, which exploits the intuition and experience of security and surveillance experts through an easy- to-use visual feedback loop. The multi-scale and location specific nature of behavior patterns in space and time is captured using a wavelet-based feature descriptor. The system learns the fundamental descriptions of the behavior patterns in a semi-supervised fashion by the higher order singular value decomposition of the space described by the training data. This training process is guided and refined by the users in an intuitive fashion. Anomalies are detected by projecting the test data into this multi-linear space and are visualized by the system to direct the attention of the user to potential problem spots. We tested our system on real-world surveillance data, and it satisfied the security concerns of the environment.
  • Keywords
    computer vision; feature extraction; learning (artificial intelligence); security of data; singular value decomposition; video surveillance; wavelet transforms; activity analysis; anomaly detection; computer vision; semisupervised learning; singular value decomposition; spatio-temporal trajectory volume; surveillance application; visual feedback loop; wavelet-based feature descriptor; Application software; Cameras; Collaboration; Computer vision; Data security; Feeds; Humans; Surveillance; System testing; Trajectory; HOSVD; anomaly detection; surveillance; trajectory; wavelets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Visual Analytics Science and Technology, 2007. VAST 2007. IEEE Symposium on
  • Conference_Location
    Sacramento, CA
  • Print_ISBN
    978-1-4244-1659-2
  • Type

    conf

  • DOI
    10.1109/VAST.2007.4388990
  • Filename
    4388990