DocumentCode
2218039
Title
The importance of accurate task arrival characterization in the design of processing cores
Author
Najaf-Abadi, Hashem H. ; Rotenberg, Eric
Author_Institution
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
fYear
2009
fDate
4-6 Oct. 2009
Firstpage
75
Lastpage
85
Abstract
This paper studies the importance of accounting for a neglected facet of overall workload behavior, the pattern of task arrival. A stochastic characterization is formulated that defines regularity in the task arrival pattern. This characterization is used as the basis for a quantitative evaluation of the importance of accurately accounting for the task arrival behavior in the design of the processing cores of a Chip Multi-processor (CMP). The results of this study show that because the methodologies traditionally used for evaluating overall performance do not accurately account for task arrival behavior, they can lead to significantly suboptimal design solutions. For instance, it is found that, for an unvarying mix of benchmarks, the best dual-core design for harmonic mean performance can result in up to 21% suboptimality depending on the task arrival pattern. In addition, it is shown that when the pattern of task arrival is prone to change, simply accounting for average task arrival behavior can result in up to 12% inaccuracy, and suboptimality in employed design solutions. A practical conclusion that can be drawn from the results of this study is that benchmark vendors need to provide not only a representative mix of instruction level behavior (the traditional application benchmarks), but also representative task arrival patterns. In addition, robustness to variation in the task arrival pattern needs to be accounted for as an overall merit in the evaluation of potential design solutions.
Keywords
microprocessor chips; multiprocessing systems; chip multiprocessor; dual-core design; harmonic mean performance; processing cores; stochastic characterization; task arrival behavior; task arrival characterization; task arrival pattern; Costs; Face; Process design; Robustness; Stochastic processes; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Workload Characterization, 2009. IISWC 2009. IEEE International Symposium on
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-5156-2
Electronic_ISBN
978-1-4244-5157-2
Type
conf
DOI
10.1109/IISWC.2009.5306795
Filename
5306795
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