• DocumentCode
    2218998
  • Title

    Challenges in future technologies

  • Author

    Eshraghian, Kamran

  • Author_Institution
    Adelaide Univ., SA, Australia
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Abstract
    The rapidly emerging area of Ultra High-Speed processing that underpins the transformation of new concepts into working systems necessitates for evolutionary changes in not only the technology base and the strategy for physical mapping of such systems, but also the all important issue of testability and testing. The systems that are mostly affected, and indeed in the next decade or so would require an ever increasing processing power, include real-time signal processors and image processors, computer vision, telecommunications, biomedical systems and personal interactive communicators having processing capability that far exceeds that of the present day super computers. Advances in conventional CMOS over the years have been based on device scaling. As submicron dimensions are approached, further scaling of CMOS becomes increasingly complex and fundamental limits will soon emerge. The emergence of the fifth generation of ICs will be characterized by complexities in excess of 10-20 million devices where integration of Photonics (control of photons) with that of Electronics (control of electrons), will provide the arena for creativity in this new design paradigm
  • Keywords
    digital integrated circuits; integrated circuit design; integrated circuit technology; integrated circuit testing; very high speed integrated circuits; biomedical systems; computer vision; design paradigm; device scaling; fifth generation ICs; image processors; physical mapping; signal processors; technology base; telecommunications; testability; ultra high-speed processing; Biomedical computing; Character generation; Computer vision; Electrons; Optical control; Photonics; Real time systems; Signal processing; System testing; Telecommunication computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510827
  • Filename
    510827