Title :
Classifying isogenous fields
Author :
Veeramachaneni, Sriharsha ; Fujisawa, Hiromichi ; Liu, Cheng-Lin ; Nagy, George
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
Classifiers that utilize style context in co-occurring patterns increase recognition accuracy. When patterns occur as long isogenous fields, this gain should increase unless negated by parameter estimation errors that increase with field length. We show that our method achieves higher accuracy with longer input fields because it can be trained accurately We also present some ongoing work on simple heuristics to reduce computational complexity of the scheme.
Keywords :
handwriting recognition; parameter estimation; pattern classification; character recognition; classifiers; computational complexity; cursive script; handwritten digits; isogenous fields; parameter estimation; recognition accuracy; Computational complexity; Educational institutions; Electronic mail; Instruments; Laboratories; NIST; Parameter estimation; Pattern recognition; Random variables; Writing;
Conference_Titel :
Frontiers in Handwriting Recognition, 2002. Proceedings. Eighth International Workshop on
Print_ISBN :
0-7695-1692-0
DOI :
10.1109/IWFHR.2002.1030882