• DocumentCode
    2219420
  • Title

    Crosstalk and low frequency radiation in a coupled microstrip line with a top cover

  • Author

    Bernal, J. ; Mesa, F. ; Jackson, D.R.

  • Author_Institution
    Dipt. Fis. Aplic. III, Univ. de Sevilla, Sevilla, Spain
  • fYear
    2012
  • fDate
    6-10 Aug. 2012
  • Firstpage
    12
  • Lastpage
    17
  • Abstract
    In this work we use a full-wave method to analyze the propagation characteristics of a coupled microstrip transmission line with a metallic top cover. This metallic top cover may be present in a microstrip structure due to a circuit package. We show that an even leaky mode and an improper odd mode can be excited in this structure at low frequencies. As a consequence, effects as radiation, power loss, and interference, which are usually found in microstrip transmission lines at high frequencies, appear instead in this structure at low frequencies, thus compromising the signal integrity on the line. We provide numerical results to demonstrate that signal propagation and crosstalk for this line cannot be accurately predicted by a conventional analysis based upon a quasi-TEM approximation and transmission line theory even at frequencies such that the cross section of the line is much smaller than the wavelength.
  • Keywords
    coupled transmission lines; crosstalk; microstrip lines; radiofrequency interference; transmission line theory; circuit package; coupled microstrip transmission line; crosstalk; full-wave method; interference; low frequency radiation; metallic top cover; microstrip structure; power loss; propagation characteristics; quasiTEM approximation; signal integrity; signal propagation; transmission line theory; Approximation methods; Attenuation; Dispersion; Interference; Microstrip; Power transmission lines; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4673-2061-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2012.6351758
  • Filename
    6351758