• DocumentCode
    2219520
  • Title

    Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems

  • Author

    Sogomonyan, E.S. ; Gössel, M.

  • Author_Institution
    Inst. of Control Sci., Acad. of Sci., Moscow, Russia
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Firstpage
    138
  • Lastpage
    144
  • Abstract
    In this paper it is shown how a self-checking checker can be designed to monitor systems with very few encoded outputs which are code words of an arbitrary separable error detection code. The checker is completely tested in normal operation mode, independent of the number of code words which are to be monitored. If an error has been indicated in normal operation mode the erroneous component of the system can be identified in test mode by the same hardware. A linear feedback shift register (LFSR) is included between the information bits of the outputs of the monitored systems and the inputs of the check-bit generator. A corrector (Cor) adjusts the check bits of the monitored system. The general systematic design method given in this paper is applied to parity codes, duplication codes, arithmetic codes and Berger codes. The approach is useful for the design of ultra-reliable fault-tolerant systems, especially for monitoring systems with very few outputs in normal operation mode
  • Keywords
    built-in self test; circuit feedback; error detection codes; integrated circuit reliability; integrated circuit testing; shift registers; Berger codes; arithmetic codes; concurrently self-testing embedded checker; corrector; design; duplication codes; error detection code; linear feedback shift register; monitoring; parity codes; ultra-reliable fault-tolerant system; Arithmetic; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Control systems; Fault tolerant systems; Hardware; Linear feedback shift registers; Monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510848
  • Filename
    510848