DocumentCode
2219530
Title
Embedded two-rail checkers with on-line testing ability
Author
Metra, Cecilia ; Favalli, Michele ; Riccò, Bruno
Author_Institution
Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
145
Lastpage
150
Abstract
This paper addresses the problem of the design of embedded two-rail checkers. In particular a simple additional circuit is proposed which can be used to make a two-rail checker receive all the codewords of the two-rail code, independently of which and how many codewords are produced by its driving functional block or checkers. The proposed circuit features a high online self-testing ability with respect to possible internal faults and a compact structure
Keywords
VLSI; automatic testing; design for testability; error detection; integrated circuit testing; integrated logic circuits; logic testing; compact structure; embedded two-rail checkers; online testing ability; self-testing ability; two-rail code; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510849
Filename
510849
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