DocumentCode :
2219562
Title :
Application of artificial neural network in fault location technique
Author :
Li, K.K. ; Lai, L.L. ; David, A.K.
Author_Institution :
Dept. of Electr. Eng., Hong Kong Polytech. Univ., Kowloon, China
fYear :
2000
fDate :
2000
Firstpage :
226
Lastpage :
231
Abstract :
Recent restructuring of the power industries such as open access and deregulation have an impact on the reliability and security of power systems. New technologies for protection and control schemes are therefore necessary to be introduced in order to maintain the system reliability and security to an acceptable level. Artificial intelligence (AI) techniques naturally become the best choice to improve the performance of the present system used. Most faults which have infeed sources from both ends of the line, especially earth faults with fault resistance, are very difficult to identify. This paper presents a novel approach that can overcome the above difficulties. The artificial neural network (ANN) is used to identify the fault location, as well as the fault resistance in a wide range of system conditions. The training of the ANN is relatively simple and fast. The predicated results from the ANN are proved to be accurate for a wide range of system conditions
Keywords :
earthing; fault location; learning (artificial intelligence); neural nets; power system analysis computing; power system faults; power system reliability; power system security; artificial intelligence; artificial neural network; earth faults; fault location technique; fault resistance; power industry restructuring; power system reliability; power system security; Artificial intelligence; Artificial neural networks; Control systems; Fault diagnosis; Fault location; Power industry; Power system faults; Power system protection; Power system reliability; Power system security;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electric Utility Deregulation and Restructuring and Power Technologies, 2000. Proceedings. DRPT 2000. International Conference on
Conference_Location :
London
Print_ISBN :
0-7803-5902-X
Type :
conf
DOI :
10.1109/DRPT.2000.855668
Filename :
855668
Link To Document :
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