• DocumentCode
    2219584
  • Title

    A self-checking ALU design with efficient codes

  • Author

    Gorshe, S.S. ; Bose, Bella

  • Author_Institution
    NEC America Inc., Hillsboro, OR, USA
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Firstpage
    157
  • Lastpage
    161
  • Abstract
    Recently, a self-testing ALU design has been proposed that uses Berger codes and compares the check value of the ALU output to a predicted check value that is calculated based on the input operand check values. Berger codes have the property of being able to detect all unidirectional errors. More efficient codes exist for detecting up to t unidirectional errors. This paper examines applying these codes to self-testing ALU designs and shows that the potential savings in check circuitry over Berger codes is up to 61%, depending on the code and the information word length
  • Keywords
    VLSI; built-in self test; error detection codes; integrated circuit testing; integrated logic circuits; logic design; logic testing; error detecting codes; self-checking ALU design; self-testing ALU; unidirectional errors; Circuit faults; Computer errors; Computer science; Out of order; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510851
  • Filename
    510851