DocumentCode
2219584
Title
A self-checking ALU design with efficient codes
Author
Gorshe, S.S. ; Bose, Bella
Author_Institution
NEC America Inc., Hillsboro, OR, USA
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
157
Lastpage
161
Abstract
Recently, a self-testing ALU design has been proposed that uses Berger codes and compares the check value of the ALU output to a predicted check value that is calculated based on the input operand check values. Berger codes have the property of being able to detect all unidirectional errors. More efficient codes exist for detecting up to t unidirectional errors. This paper examines applying these codes to self-testing ALU designs and shows that the potential savings in check circuitry over Berger codes is up to 61%, depending on the code and the information word length
Keywords
VLSI; built-in self test; error detection codes; integrated circuit testing; integrated logic circuits; logic design; logic testing; error detecting codes; self-checking ALU design; self-testing ALU; unidirectional errors; Circuit faults; Computer errors; Computer science; Out of order; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510851
Filename
510851
Link To Document