• DocumentCode
    2219638
  • Title

    Thermal modeling of BOX/DTI enclosed power devices with Green´s function approach

  • Author

    Moebus, Kai E. ; Zimmermann, Yves ; Wedel, Gerald ; Schröter, Michael

  • Author_Institution
    Electr. Eng. Dept., Tech. Univ. Dresden, Dresden, Germany
  • fYear
    2011
  • fDate
    27-28 Sept. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Accurate thermal models for power devices are crucial due to the simultaneous introduction of deep trenches (DTI) and silicon on insulator (SOI) technology. A computationally efficient geometry dependent thermal model is presented that avoids the time and cost penalty of numerical thermal simulations and utilizes the Green´s function approach in combination with mixed boundary conditions. The derived model is accurate (relative temperature error <;10%) and valid for dimensions ranging between 5μm and 200μm. The new model allows for on-the-fly calculations of the thermal resistance Rth as well as thermal coupling coefficients for multi-finger devices, enabling predictive modeling and concurrent engineering.
  • Keywords
    Green´s function methods; isolation technology; power semiconductor devices; silicon-on-insulator; BOX-DTI; Green´s function approach; SOI technology; Si; concurrent engineering; deep trenches; geometry; on-the-fly calculations; power semiconductor devices; silicon-on-insulator technology; size 5 mum to 200 mum; thermal modeling; thermal resistance; Diffusion tensor imaging; Heating; Integrated circuit modeling; Mathematical model; Numerical models; Silicon; Thermal resistance; Silicon on insulator technology (SOI); deep trench isolation (DTI); geometric thermal modeling; power semiconductor devices; self-heating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference Dresden (SCD), 2011
  • Conference_Location
    Dresden
  • Print_ISBN
    978-1-4577-0431-4
  • Type

    conf

  • DOI
    10.1109/SCD.2011.6068767
  • Filename
    6068767