DocumentCode :
2219638
Title :
Thermal modeling of BOX/DTI enclosed power devices with Green´s function approach
Author :
Moebus, Kai E. ; Zimmermann, Yves ; Wedel, Gerald ; Schröter, Michael
Author_Institution :
Electr. Eng. Dept., Tech. Univ. Dresden, Dresden, Germany
fYear :
2011
fDate :
27-28 Sept. 2011
Firstpage :
1
Lastpage :
4
Abstract :
Accurate thermal models for power devices are crucial due to the simultaneous introduction of deep trenches (DTI) and silicon on insulator (SOI) technology. A computationally efficient geometry dependent thermal model is presented that avoids the time and cost penalty of numerical thermal simulations and utilizes the Green´s function approach in combination with mixed boundary conditions. The derived model is accurate (relative temperature error <;10%) and valid for dimensions ranging between 5μm and 200μm. The new model allows for on-the-fly calculations of the thermal resistance Rth as well as thermal coupling coefficients for multi-finger devices, enabling predictive modeling and concurrent engineering.
Keywords :
Green´s function methods; isolation technology; power semiconductor devices; silicon-on-insulator; BOX-DTI; Green´s function approach; SOI technology; Si; concurrent engineering; deep trenches; geometry; on-the-fly calculations; power semiconductor devices; silicon-on-insulator technology; size 5 mum to 200 mum; thermal modeling; thermal resistance; Diffusion tensor imaging; Heating; Integrated circuit modeling; Mathematical model; Numerical models; Silicon; Thermal resistance; Silicon on insulator technology (SOI); deep trench isolation (DTI); geometric thermal modeling; power semiconductor devices; self-heating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference Dresden (SCD), 2011
Conference_Location :
Dresden
Print_ISBN :
978-1-4577-0431-4
Type :
conf
DOI :
10.1109/SCD.2011.6068767
Filename :
6068767
Link To Document :
بازگشت