Title :
Improving the accuracy of diagnostics provided by fault dictionaries
Author :
Sheppard, John W. ; Simpson, William R.
Author_Institution :
ARINC Res. Corp., Annapolis, MD, USA
fDate :
28 Apr-1 May 1996
Abstract :
Using nearest neighbor classification with fault dictionaries to resolve inexact signature matches in digital circuit diagnosis is inadequate. Nearest neighbor focuses on the possible diagnoses rather than on the tests. Our alternative-the information flow model-focuses on test information in the fault dictionary to provide more accurate diagnostics
Keywords :
VLSI; automatic testing; circuit analysis computing; digital integrated circuits; fault diagnosis; integrated circuit testing; logic testing; diagnostics accuracy improvement; digital circuit diagnosis; fault dictionaries; information flow model; nearest neighbor classification; Automatic testing; Circuit faults; Circuit testing; Dictionaries; Digital circuits; Digital simulation; Electronic equipment testing; Fault detection; Fault diagnosis; Nearest neighbor searches;
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7304-4
DOI :
10.1109/VTEST.1996.510855
