Title :
A sampling technique for diagnostic fault simulation
Author :
Chakravarty, Sreejit
Author_Institution :
Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
fDate :
28 Apr-1 May 1996
Abstract :
The quality of diagnostic test sets (DTS) are determined using diagnostic fault simulation (DFS). We propose a novel approximation algorithm, called “EC/IC Sampling”, for DFS. It samples the set of equivalence classes (EC)/indistinguishable classes (IC). An approach to sample ECs/ICs implicitly, without explicitly enumerating the set of ECs/ICs, is presented. Experimental evaluation of the proposed technique show it to be very effective
Keywords :
circuit analysis computing; equivalence classes; fault diagnosis; integrated circuit testing; set theory; EC/IC Sampling; approximation algorithm; diagnostic fault simulation; diagnostic test sets; equivalence classes; indistinguishable classes; sampling technique; Approximation algorithms; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Fault detection; Fault diagnosis; Sampling methods; Sequential circuits;
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7304-4
DOI :
10.1109/VTEST.1996.510857
