DocumentCode
2219735
Title
A sampling technique for diagnostic fault simulation
Author
Chakravarty, Sreejit
Author_Institution
Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
192
Lastpage
197
Abstract
The quality of diagnostic test sets (DTS) are determined using diagnostic fault simulation (DFS). We propose a novel approximation algorithm, called “EC/IC Sampling”, for DFS. It samples the set of equivalence classes (EC)/indistinguishable classes (IC). An approach to sample ECs/ICs implicitly, without explicitly enumerating the set of ECs/ICs, is presented. Experimental evaluation of the proposed technique show it to be very effective
Keywords
circuit analysis computing; equivalence classes; fault diagnosis; integrated circuit testing; set theory; EC/IC Sampling; approximation algorithm; diagnostic fault simulation; diagnostic test sets; equivalence classes; indistinguishable classes; sampling technique; Approximation algorithms; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Fault detection; Fault diagnosis; Sampling methods; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510857
Filename
510857
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