Title :
Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages
Author :
Chatterjee, A. ; Jayabharathi, Rathish ; Pant, P. ; Abraham, J.A.
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
28 Apr-1 May 1996
Abstract :
In this paper we propose to use an output signal waveform analysis method called signal waveform integration for detection of stuck-at failures in combinational circuits. Non-robust tests are applied at-speed or faster to achieve high fault coverage, low test application time and detectability of redundant faults using directed random test generation techniques
Keywords :
automatic testing; combinational circuits; fault diagnosis; integrated circuit testing; logic testing; redundancy; waveform analysis; combinational circuits; detectability; directed random test generation techniques; fault coverage; nonrobust tests; redundant faults; signal waveform analysis; signal waveform integration; stuck-fault detection; test application time; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Delay; Electrical fault detection; Fault detection; Robustness; Signal analysis; Signal detection;
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7304-4
DOI :
10.1109/VTEST.1996.510879
