DocumentCode
2220294
Title
Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages
Author
Chatterjee, A. ; Jayabharathi, Rathish ; Pant, P. ; Abraham, J.A.
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
354
Lastpage
359
Abstract
In this paper we propose to use an output signal waveform analysis method called signal waveform integration for detection of stuck-at failures in combinational circuits. Non-robust tests are applied at-speed or faster to achieve high fault coverage, low test application time and detectability of redundant faults using directed random test generation techniques
Keywords
automatic testing; combinational circuits; fault diagnosis; integrated circuit testing; logic testing; redundancy; waveform analysis; combinational circuits; detectability; directed random test generation techniques; fault coverage; nonrobust tests; redundant faults; signal waveform analysis; signal waveform integration; stuck-fault detection; test application time; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Delay; Electrical fault detection; Fault detection; Robustness; Signal analysis; Signal detection;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510879
Filename
510879
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