• DocumentCode
    2220304
  • Title

    Critical EMC test issues needing early resolution

  • Author

    White, Curtis B.

  • Author_Institution
    EMC Consultant 3945 Gray Fox Run, Rockford, Illinois, 61114, USA
  • fYear
    2012
  • fDate
    6-10 Aug. 2012
  • Firstpage
    127
  • Lastpage
    131
  • Abstract
    EMC test programs are often very lengthy and expensive. It is very important to address a number of critical EMC test issues as early in the program as possible to ensure complete and accurate planning, budgeting and design criteria. This paper presents and discusses a number of typical critical EMC test issues needing early resolution in programs. Suggestions are also provided to help control the potential impact of these issues.
  • Keywords
    electromagnetic compatibility; planning; testing; EMC test issues; EMC test programs; budgeting; design criteria; early resolution; planning; Electromagnetic compatibility; IEEE Potentials; Laboratories; Schedules; Transient analysis; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4673-2061-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2012.6351797
  • Filename
    6351797
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2220304