Title :
A multiscale transient event detector for nonintrusive load monitoring
Author :
Leeb, Steven B. ; Kirtley, James L., Jr.
Author_Institution :
Lab. for Electromagn. & Electron. Syst., MIT, Cambridge, MA, USA
Abstract :
The nonintrusive load monitor (NILM) determines the operating schedule of the major electrical loads in a building from measurements made at the utility service entry. This paper describes a multiscale transient event detection algorithm that extends the applicability of the NILM to challenging commercial and industrial sites. The performance of the algorithm is illustrated with results from a prototype event detector
Keywords :
load management; power consumption; power system measurement; power system transients; building; electrical loads; multiscale transient event detector; nonintrusive load monitoring; operating schedule; utility service; Detectors; Electromagnetic measurements; Electromagnetic transients; Event detection; Job shop scheduling; Laboratories; Monitoring; Prototypes; Signal processing algorithms; Steady-state;
Conference_Titel :
Industrial Electronics, Control, and Instrumentation, 1993. Proceedings of the IECON '93., International Conference on
Conference_Location :
Maui, HI
Print_ISBN :
0-7803-0891-3
DOI :
10.1109/IECON.1993.339053
