DocumentCode :
2220377
Title :
Power consumption considerations of C-SET logics for digital applications
Author :
Jeong, Yoon-Ha
Author_Institution :
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., South Korea
Volume :
2
fYear :
2001
fDate :
22-25 Oct. 2001
Firstpage :
1373
Abstract :
We have investigated the power consumption of a complementary capacitive coupled single electron transistor (complementary C-SET) inverter, based on conventional CMOS design methodology for digital applications using Monte Carlo simulations. Static dissipation due to thermally enhanced tunneling becomes significant as the operation temperature increases. It has been found that increment of output capacitance to suppress output voltage fluctuation causes a degradation in the switching speed, as well as an increase in power consumption. We also introduced a design scheme using multi-tunnel junction SET for reducing the power consumption of C-SET logic circuits. The C-SET inverter using a simple three-tunnel junction SET can reduce the leakage power dissipation by a factor of 10. Our results show that, while the power consumption per elementary C-SET logic gate can be made as small as 10-9 W, high-density integration will not be obtained by using the same method with the CMOS circuit.
Keywords :
CMOS logic circuits; Monte Carlo methods; logic gates; power consumption; semiconductor device measurement; single electron transistors; tunnelling; 10-9 W; C-SET logics; CMOS circuit; CMOS design methodology; Monte Carlo simulations; complementary C-SET inverter; complementary capacitive coupled single electron transistor inverter; digital applications; leakage power dissipation; multi-tunnel junction SET; operation temperature effects; power consumption considerations; static dissipation; thermally enhanced tunneling; CMOS logic circuits; Capacitance; Design methodology; Energy consumption; Inverters; Single electron transistors; Temperature; Thermal degradation; Tunneling; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Print_ISBN :
0-7803-6520-8
Type :
conf
DOI :
10.1109/ICSICT.2001.982157
Filename :
982157
Link To Document :
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