• DocumentCode
    2220415
  • Title

    On simulating OATS near-field emission measurements via GTEM cell measurements

  • Author

    Wilson, P.

  • Author_Institution
    EMC Baden Ltd., Daettwil, Switzerland
  • fYear
    1993
  • fDate
    9-13 Aug 1993
  • Firstpage
    53
  • Lastpage
    57
  • Abstract
    The use of a gigahertz transverse electromagnetic (GTEM) cell for both near-field and far-field radiated emission testing is considered. The approach is to model the radiation from the device under test (DUT) as due to an equivalent set of multipole moments. A sequence of three, six, or nine GTEM measurements is used to determine the equivalent multipole moments for a particular DUT. The multipole model makes it possible to predict both the DUT free space radiation pattern and the DUT radiation over a ground screen. The correlation between GTEM cell and open area test site (OATS) measurements for the far field case (>30 MHz, 3-m distance) has been examined previously. Correlation of sources in the near field (<30 MHz, 1-m distance) is considered in the present work. Agreement between OATS data and GTEM cell correlated data is better than 2 dB
  • Keywords
    correlation methods; earthing; electric field measurement; electromagnetic interference; electronic equipment testing; magnetic field measurement; simulation; test facilities; 3 m; 30 MHz; DUT; GTEM cell measurements; OATS near-field emission measurements; correlated data; correlation; device under test; far-field radiated emission testing; free space radiation pattern; gigahertz transverse electromagnetic cell; ground screen; multipole model; multipole moments; near-field radiated emission testing; open area test site; simulation; Antenna radiation patterns; Impedance; Magnetic field measurement; Magnetic resonance; Open area test sites; Position measurement; Power measurement; Predictive models; TEM cells; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    0-7803-1304-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1993.473779
  • Filename
    473779