Title :
Multiple fault diagnosis using n-detection tests
Author :
Wang, Zhiyuan ; Marek-Sadowska, Malgorzata ; Tsai, Kun-Han ; Rajski, Janusz
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
We study the relationship between multiple fault diagnosability and fault detection count. Instead of developing a complex diagnostic algorithm for multiple fault behavior, we change the test sets used in test and diagnosis. This allows us to apply a simple single-fault based diagnostic algorithm, and yet achieve very good diagnosability for the failure test cases caused by multiple faults. We have verified experimentally the effectiveness of n-detection tests for multiple-fault cases and explained the results in probabilistic terms.
Keywords :
automatic testing; fault diagnosis; multiple fault diagnosis; n-detection test; Bridge circuits; Change detection algorithms; Circuit faults; Circuit testing; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis; Manufacturing; Sequential analysis;
Conference_Titel :
Computer Design, 2003. Proceedings. 21st International Conference on
Print_ISBN :
0-7695-2025-1
DOI :
10.1109/ICCD.2003.1240895
