DocumentCode
2220474
Title
Measurement Techniques For Microwave Device Characterization And Modelling
fYear
1990
fDate
23-23 April 1990
Keywords
Calibration; Conferences; Measurement techniques; Microstrip; Microwave devices; Microwave measurements; Microwave theory and techniques; Optimization methods; Scattering parameters; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on
Conference_Location
Stuttgart, Germany
Type
conf
DOI
10.1109/MDCM.1990.666349
Filename
666349
Link To Document