Title : 
Substation switching electromagnetic transient analysis using the time domain integral equation with a high order implicit scheme
         
        
            Author : 
Xiang, Hongjun ; Chang, Sughun ; Zou, Jun ; Yuan, Jiansheng ; Shenderey, Sergey V.
         
        
            Author_Institution : 
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
         
        
        
        
        
        
            Abstract : 
A fast electric field integral in time domain using the uneven discretization and the implicit scheme is proposed to calculate the switching electromagnetic transient at a substation. The switching transient currents and the resultant radiated electromagnetic field are calculated. The propose d approach has the strength to model the bus system at a substation with a more complicated and realistic configuration that is difficult to simulate using the circuit-based method, because all the electromagnetic couplings within the bus system are included globally. The proposed method might be one of good candidates to predicate the EMI level at a substation.
         
        
            Keywords : 
EMTP; electric field integral equations; electromagnetic coupling; electromagnetic interference; power engineering computing; substation automation; time-domain analysis; EMI level; bus system; circuit-based method; electromagnetic coupling; electromagnetic field radiation; fast electric field integral; high order implicit scheme; substation switching electromagnetic transient analysis; switching transient current; time domain integral equation; Conductors; Integrated circuit modeling; Switches; Time domain analysis; Transient analysis; Wires; EMC/EMI; Switching transient; TDIE;
         
        
        
        
            Conference_Titel : 
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
         
        
            Conference_Location : 
Pittsburgh, PA
         
        
        
            Print_ISBN : 
978-1-4673-2061-0
         
        
        
            DOI : 
10.1109/ISEMC.2012.6351805