• DocumentCode
    2220589
  • Title

    Linear response model of Si single electron transistor

  • Author

    Zhou, S. ; Jiang, J.F. ; Cai, Q.Y.

  • Author_Institution
    Res. Inst. of Micro/Nano Sci. & Technol., Shanghai Jiao Tong Univ., China
  • Volume
    2
  • fYear
    2001
  • fDate
    22-25 Oct. 2001
  • Firstpage
    1411
  • Abstract
    A linear response model of a Si single electron transistor (Si-SET) is studied. The Coulomb island of the Si-SET with a discrete level spectrum is weakly coupled to two electron reservoirs via nanotunneling junction barriers. The reservoirs, named source and drain electrodes respectively, are taken to be in thermal equilibrium at temperature T and Fermi energy EF. The Si-SET is considered to be driven in linear response, i.e., the conductance G is defined as G = I/V in the limit V tends to 0. We analyze the conductance characteristics of the Si-SET, which make it possible to simulate circuit characteristics of the Si-SET from physical parameters.
  • Keywords
    Coulomb blockade; digital simulation; elemental semiconductors; semiconductor device models; silicon; single electron transistors; tunnelling; Coulomb island; Fermi energy; Si; Si-SET; circuit characteristics; conductance characteristics; discrete level spectrum; electron reservoirs; linear response model; nanotunneling junction barriers; simulation; single electron transistor; thermal equilibrium; Capacitance; Circuits; Electrodes; Magnetic tunneling; Quantum dots; Reservoirs; Silicon; Single electron transistors; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
  • Print_ISBN
    0-7803-6520-8
  • Type

    conf

  • DOI
    10.1109/ICSICT.2001.982167
  • Filename
    982167