DocumentCode
2220589
Title
Linear response model of Si single electron transistor
Author
Zhou, S. ; Jiang, J.F. ; Cai, Q.Y.
Author_Institution
Res. Inst. of Micro/Nano Sci. & Technol., Shanghai Jiao Tong Univ., China
Volume
2
fYear
2001
fDate
22-25 Oct. 2001
Firstpage
1411
Abstract
A linear response model of a Si single electron transistor (Si-SET) is studied. The Coulomb island of the Si-SET with a discrete level spectrum is weakly coupled to two electron reservoirs via nanotunneling junction barriers. The reservoirs, named source and drain electrodes respectively, are taken to be in thermal equilibrium at temperature T and Fermi energy EF. The Si-SET is considered to be driven in linear response, i.e., the conductance G is defined as G = I/V in the limit V tends to 0. We analyze the conductance characteristics of the Si-SET, which make it possible to simulate circuit characteristics of the Si-SET from physical parameters.
Keywords
Coulomb blockade; digital simulation; elemental semiconductors; semiconductor device models; silicon; single electron transistors; tunnelling; Coulomb island; Fermi energy; Si; Si-SET; circuit characteristics; conductance characteristics; discrete level spectrum; electron reservoirs; linear response model; nanotunneling junction barriers; simulation; single electron transistor; thermal equilibrium; Capacitance; Circuits; Electrodes; Magnetic tunneling; Quantum dots; Reservoirs; Silicon; Single electron transistors; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Print_ISBN
0-7803-6520-8
Type
conf
DOI
10.1109/ICSICT.2001.982167
Filename
982167
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