• DocumentCode
    2220605
  • Title

    Analytical representations for frequency dependences of microwave permeability

  • Author

    Rozanov, Konstantin N. ; Koledintseva, Marina Y.

  • Author_Institution
    Inst. for Theor. & Appl. Electromagn., Moscow, Russia
  • fYear
    2012
  • fDate
    6-10 Aug. 2012
  • Firstpage
    422
  • Lastpage
    427
  • Abstract
    Electromagnetic materials applied to solve various EMC and EMI problems require adequate analytical description of their RF and microwave material parameters. This is necessary for numerical optimization of wideband electromagnetic performance of devices incorporating these materials. The paper discusses the shape of frequency dependences of microwave permeability in homogeneous materials and composites. The Lorentzian frequency dispersion law is shown to allow for rather accurate description of all types of magnetic loss peaks, including those related to the ferromagnetic resonance and the effect of eddy currents. To model wideband electromagnetic performance of composites, mixing laws are typically used. The problem is which mixing law is to be chosen to adequately describe a particular composite. The paper gives recommendations on how to make the choice of a proper mixing rule.
  • Keywords
    composite materials; eddy currents; electromagnetic compatibility; electromagnetic interference; microwave materials; numerical analysis; optimisation; permeability; EMC problems; EMI problems; Lorentzian frequency dispersion law; RF material parameters; composite wideband electromagnetic performance; eddy current effect; electromagnetic materials; ferromagnetic resonance; frequency dependences; homogeneous composites; homogeneous materials; magnetic loss peaks; microwave material parameters; microwave permeability; mixing law; mixing rule; numerical optimization; Dispersion; Magnetic domains; Magnetic resonance; Magnetomechanical effects; Materials; Permeability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4673-2061-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2012.6351810
  • Filename
    6351810