Title :
Fault location of a teed-network with wavelet transform and neural networks
Author :
Lai, L.L. ; Vaseekar, E. ; Subasinghe, H. ; Rajkumar, N. ; Carter, A. ; Gwyn, B.J.
Author_Institution :
Energy Syst. Group, City Univ., London, UK
Abstract :
A new technique using wavelet transforms and neural networks for fault location in a tee-circuit is proposed in this paper. Fault simulation is carried out in EMTP96 using a frequency dependent transmission line model. Voltage and current signals are obtained for a single phase (phase-A) to ground fault at every 500 m distance on one of the branches, which is 64.09 km long. Simulation is carried out for 3 cycles (60 ms) with step size Δt, of 2.5 μs to abstract the high frequency component of the signal and every 100 points have been selected as output. Two cycles of waveform, covering pre-fault and post-fault information are abstracted for further analysis. These waveforms are then used in wavelet analysis to generate the training pattern. Two different mother wavelets have been used to decompose the signal, from which the statistical information is abstracted as the training pattern. RBF network was trained and cross-validated with unseen data
Keywords :
EMTP; fault location; learning (artificial intelligence); power system analysis computing; power system faults; radial basis function networks; wavelet transforms; EMTP96; RBF network; computer simulation; frequency dependent transmission line model; high frequency component; mother wavelets; neural networks; post-fault information; pre-fault information; signal decomposition; single phase-to-ground fault; teed power network fault location; training pattern; wavelet transform; Fault location; Frequency dependence; Information analysis; Neural networks; Pattern analysis; Radial basis function networks; Transmission lines; Voltage; Wavelet analysis; Wavelet transforms;
Conference_Titel :
Electric Utility Deregulation and Restructuring and Power Technologies, 2000. Proceedings. DRPT 2000. International Conference on
Conference_Location :
London
Print_ISBN :
0-7803-5902-X
DOI :
10.1109/DRPT.2000.855716