Title :
S-parameter Measurements In The Microstrip Environment - The Hard Way
Author_Institution :
Hahn-Meitner-Institut, Berlin
Keywords :
Bandwidth; FETs; Fixtures; Gallium arsenide; Impedance; Inductance; Microstrip; Pulse amplifiers; Scattering parameters; Testing;
Conference_Titel :
Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on
Conference_Location :
Stuttgart, Germany
DOI :
10.1109/MDCM.1990.666350
