Title : 
Prediction of radiation-induced frequency locking and shifting in a microwave oscillator
         
        
            Author : 
Kuo, Nai-Chung ; Hsieh, Han-Chang ; Chen, Jay-San ; Chiu, Cheng-Nan ; Lin, Ming-Shing ; Chen, Chun Hsiung
         
        
            Author_Institution : 
Bur. of Stand., Metrol. & Inspection (BSMI), Minist. of Econ. Affairs, Taiwan
         
        
        
        
        
        
            Abstract : 
In this paper, an effective and efficient approach is proposed to evaluate the frequency shifting and locking degradation in a microwave oscillator, illuminated by an incident plane wave. The analysis is performed by using equation-based equivalent sources embedded in the circuit schematic and incorporating the harmonic balance (HB) simulator. Most importantly, an auxiliary source is added in the simulation under the non-perturbation condition to search for the non-trivial solutions. A 795-MHz oscillator is created and simulated by this approach. The circuit performance measured inside an anechoic chamber is compared to the simulation with good agreement.
         
        
            Keywords : 
UHF oscillators; anechoic chambers (electromagnetic); microwave oscillators; anechoic chamber; auxiliary source; circuit schematic; equation-based equivalent sources; frequency 795 MHz; harmonic balance simulator; incident plane wave; microwave oscillator; nonperturbation condition; nontrivial solutions; radiation-induced frequency locking; radiation-induced frequency shifting; Integrated circuit modeling; Mathematical model; Microstrip; Microwave circuits; Microwave oscillators; Radiated susceptibility; electromagnetic immunity; harmonic balance; oscillator;
         
        
        
        
            Conference_Titel : 
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
         
        
            Conference_Location : 
Pittsburgh, PA
         
        
        
            Print_ISBN : 
978-1-4673-2061-0
         
        
        
            DOI : 
10.1109/ISEMC.2012.6351819