• DocumentCode
    2220832
  • Title

    Author index

  • fYear
    1996
  • fDate
    April 28 1996-May 1 1996
  • Firstpage
    508
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ, USA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510900
  • Filename
    510900