DocumentCode :
2221171
Title :
On combining pinpoint test set relaxation and run-length codes for reducing test data volume
Author :
Kajihara, Seiji ; Doi, Yasumi ; Li, Lei ; Chakrabarty, Krishnendu
Author_Institution :
Dept. of Comput. Sci. & Electron., Kyushu Inst. of Technol., Japan
fYear :
2003
fDate :
13-15 Oct. 2003
Firstpage :
387
Lastpage :
392
Abstract :
We present a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or frequency-directed run-length (FDR) coding. Before encoding a given set of test patterns, we selectively relax some specified bits of the test patterns. By changing a specified bit with value 1 to a don´t-care, two consecutive runs of 0s in the test sequence can be concatenated into a longer run of 0, thereby facilitating run-length coding. This procedure retains the fault coverage of the test set. Since the increase in compression depends on the lengths of the two runs that are concatenated with each bit relaxation, a lookup table, referred to as the gain table, is pre-computed and used during the test set relaxation procedure to maximize the likelihood of increasing the amount of test data compression. The gain table is used to pinpoint the bit positions with value 1, which when relaxed to don´t-cares, will yield the most compression. In this way, the given test pattern set is appropriately modified as a preprocessing step before test compression. Experimental results for the ISCAS benchmark circuits show that the proposed method can be used to increase the effectiveness of run-length coding methods for test data compression.
Keywords :
data compression; fault diagnosis; logic testing; optimisation; relaxation theory; runlength codes; table lookup; FDR coding; Golomb coding; frequency-directed run-length; gain table; lookup table; pinpoint test set relaxation; run-length encoding technique; test data compression; test data volume reduction; test pattern; Benchmark testing; Circuit faults; Circuit testing; Concatenated codes; Encoding; Frequency; Relaxation methods; Table lookup; Test data compression; Volume relaxation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design, 2003. Proceedings. 21st International Conference on
ISSN :
1063-6404
Print_ISBN :
0-7695-2025-1
Type :
conf
DOI :
10.1109/ICCD.2003.1240925
Filename :
1240925
Link To Document :
بازگشت