Title :
A method to find don´t care values in test sequences for sequential circuits
Author :
Higami, Yoshinobu ; Kobayashi, Shin-ya ; Takamatsu, Yuzo ; Kajihara, Seiji ; Pomeranz, Irith
Author_Institution :
Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan
Abstract :
We propose a method to find don´t care (X) values in a test sequence for a sequential circuit. Given a fully specified test sequence generated by a sequential ATPG, the proposed method produces a test sequence containing Xs without losing stuck-at fault coverage of the original test sequence.
Keywords :
automatic test pattern generation; fault diagnosis; logic testing; sequential circuits; don´t care value; sequential ATPG; sequential circuit; stuck-at fault coverage; test sequence; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Fault detection; Logic testing; Sequential analysis; Sequential circuits;
Conference_Titel :
Computer Design, 2003. Proceedings. 21st International Conference on
Print_ISBN :
0-7695-2025-1
DOI :
10.1109/ICCD.2003.1240927
