Title :
Alternatives to Optimizer-Based Methods for Microwave Transistor Small-Signal Equivalent Circuit Parameters and S-Parameter Errors
Author_Institution :
Phoenix Corporate Research Laboratories
Keywords :
Data mining; Equivalent circuits; Measurement errors; Microwave devices; Microwave measurements; Microwave theory and techniques; Microwave transistors; Optimization methods; Parameter extraction; Scattering parameters;
Conference_Titel :
Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on
Conference_Location :
Stuttgart, Germany
DOI :
10.1109/MDCM.1990.666352
