DocumentCode
2221517
Title
Paradigm shift for jitter and noise in design and test > Gb/s communication systems (an invited paper for ICCD 2003)
Author
Li, Mike ; Wilstrup, Jan
Author_Institution
Wavecrest Corp., San Jose, CA, USA
fYear
2003
fDate
13-15 Oct. 2003
Firstpage
467
Lastpage
472
Abstract
As the communication speed/data rate approaches 1 Gb/s and beyond, timing jitter and amplitude noise become the major limiting factors for system performance. Traditional methods used in simulating, analyzing, modeling, and quantifying jitter and noise in terms of peak-to-peak and/or RMS become no longer accurate and sufficient. As such, new methods with better accuracy and comprehension are called for. We first discuss new jitter and noise modeling and analysis methods for both design and test based on statistical signal theory invoking probability density function (pdf) and cumulative distribution function (cdf) and the corresponding component distributions of deterministic and random to quantify jitter, noise, and bit error rate (BER) for communication systems. Secondly, we introduce jitter and noise transfer functions and their important roles-played in estimating relevant jitter, noise, and BER in the system. Thirdly, we introduce and illustrate how those methods can be used in designing and testing > Gb/s communication systems, such as fibre channel (FC), giga bit Ethernet (GBE), and PCI Express.
Keywords
error statistics; probability; random noise; statistical distributions; telecommunication signalling; timing jitter; transfer functions; > Gb/s communication systems design; BER; PCI Express; amplitude noise modeling; bit error rate; cumulative distribution function; fibre channel; giga bit Ethernet; limiting factors; noise transfer functions; probability density function; random component distributions; statistical signal theory; system performance; timing jitter; Analytical models; Bit error rate; Communication systems; Design methodology; Noise level; Signal analysis; Signal design; System performance; System testing; Timing jitter;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design, 2003. Proceedings. 21st International Conference on
ISSN
1063-6404
Print_ISBN
0-7695-2025-1
Type
conf
DOI
10.1109/ICCD.2003.1240942
Filename
1240942
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