DocumentCode :
2221560
Title :
Nonlinear Model Parameter Extraction for HBJTs Based on S-Parameter Measurement
Author :
Kreuzgruber, P. ; Bonek, E. ; Scholtz, A.L.
Author_Institution :
University of Technology Vienna
fYear :
1990
fDate :
23-23 April 1990
Firstpage :
53
Lastpage :
66
Keywords :
Circuit simulation; Circuit testing; Computational modeling; Fixtures; Frequency measurement; Microwave circuits; Microwave measurements; Parameter extraction; Radio frequency; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on
Conference_Location :
Stuttgart, Germany
Type :
conf
DOI :
10.1109/MDCM.1990.666353
Filename :
666353
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2221560
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