DocumentCode :
2221863
Title :
Small- And Large-signal Characterization Methods, Modelling And Verification
Author :
Kompa, G.
Author_Institution :
University Of Kassel
fYear :
1990
fDate :
23-23 April 1990
Firstpage :
67
Lastpage :
97
Keywords :
Calibration; Gallium arsenide; HEMTs; MESFETs; MODFET circuits; Microwave FETs; Microwave devices; Parameter extraction; Scattering parameters; Semiconductor device packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on
Conference_Location :
Stuttgart, Germany
Type :
conf
DOI :
10.1109/MDCM.1990.666354
Filename :
666354
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2221863
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