DocumentCode

2221999

Title

On-wafer calibration, device measurements, and modelling

Author

Strid, E.

Author_Institution

Cascade Microtech

fYear

1990

fDate

23-23 April 1990

Firstpage

98

Lastpage

108

Keywords

Calibration; Data mining; Delay effects; FETs; Noise measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on

Conference_Location

Stuttgart, Germany

Type

conf

DOI

10.1109/MDCM.1990.666355

Filename

666355