مرکز منطقه ای اطلاع رساني علوم و فناوري - On-wafer calibration, device measurements, and modelling

DocumentCode :

2221999

Title :

On-wafer calibration, device measurements, and modelling

Author :

Strid, E.

Author_Institution :

Cascade Microtech

fYear :

1990

fDate :

23-23 April 1990

Firstpage :

Lastpage :

108

Keywords :

Calibration; Data mining; Delay effects; FETs; Noise measurement;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on

Conference_Location :

Stuttgart, Germany

Type :

conf

DOI :

10.1109/MDCM.1990.666355

Filename :

666355

Link To Document :