Title :
Investigation of semiconductor structures and two-dimensional systems by non-destructive contactless methods
Author :
Kornilovich, A.A.
Author_Institution :
Novosibirsk State Tech. Univ., Russia
Abstract :
In this paper the investigation of semiconductors by the high-frequency, magneto-optical and microwave methods is presented. These methods are based on the observation of the oscillation and resonance effects in semiconductors. The experimental data of determining transport and energy parameters of structures obtained in the observation of the Shubnikov-de Haas effect and nonlinear spin resonance due to stimulated combinational light scattering method with the signal amplification are considered
Keywords :
Shubnikov-de Haas effect; high-frequency effects; light scattering; magneto-optical effects; semiconductors; GaAs-AlGaAs; InSb; Shubnikov-de Haas effect; energetic parameters; high-frequency; magneto-optical method; microwave methods; nondestructive contactless methods; nonlinear spin resonance; resonance effects; semiconductor structures; semiconductors; signal amplification; stimulated combinational light scattering method; transport; two-dimensional systems; Free electron lasers; Frequency; Laser tuning; Magnetic field measurement; Magnetic resonance; Nonlinear optics; Optical films; Optical scattering; Resonance light scattering; Testing;
Conference_Titel :
Microwave Electronics: Measurements, Identification, Application Conference, 2001. MEMIA 2001
Conference_Location :
Novosibirsk
Print_ISBN :
0-7803-6743-X
DOI :
10.1109/MEMIA.2001.982338
