DocumentCode

2222273

Title

Measurement And Modelling Of High Performance Mesfet And Hemt Devices

Author

Brookbanks, D.M.

Author_Institution

Plessey Technology Limited

fYear

1990

fDate

23-23 April 1990

Firstpage

109

Lastpage

121

Keywords

Calibration; Circuits; Current measurement; Data mining; Dielectric measurements; HEMTs; MESFETs; Probes; Scattering parameters; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on

Conference_Location

Stuttgart, Germany

Type

conf

DOI

10.1109/MDCM.1990.666356

Filename

666356