Title :
Measurement And Modelling Of High Performance Mesfet And Hemt Devices
Author :
Brookbanks, D.M.
Author_Institution :
Plessey Technology Limited
Keywords :
Calibration; Circuits; Current measurement; Data mining; Dielectric measurements; HEMTs; MESFETs; Probes; Scattering parameters; Voltage;
Conference_Titel :
Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on
Conference_Location :
Stuttgart, Germany
DOI :
10.1109/MDCM.1990.666356
