• DocumentCode
    2222317
  • Title

    An x-bar control chart economic design sampling strategy for non-normally distributed data under gamma (λ, 2) failure models

  • Author

    Li, F.C. ; Yeh, C.H. ; Wang, P.K.

  • Author_Institution
    Dept. of Inf. & Manage., Jen Teh Junior Coll. of Manage., Taiwan
  • fYear
    2008
  • fDate
    8-11 Dec. 2008
  • Firstpage
    253
  • Lastpage
    256
  • Abstract
    This study compares an x-bar control chart economic design with a variable sampling interval (VSI) and a fixed-length sampling (FSI) for non-normal data under Gamma (λ, 2) shock models. In earlier investigations, constant sampling intervals were widely employed by the control chart´s designers and users because of their administrative simplicity. Most control chart economic designs assumed the failure mechanism, which belongs to the Poisson distribution. However, this is not usually pragmatic. Banerjee and Rahim (1993) presented a cost model using VSI under a process-failure mechanism that followed a Gamma (λ, 2) model with an increased hazard rate. These subgroup measurements were assumed to be normally distributed when designing control charts. However, that assumption may not be tenable in this research. Hence, this study employs a numerical example to indicate the solution procedure and to implement the sensitivity analysis while comparing the results of using various sampling interval approaches in non-normally distributed data.
  • Keywords
    control charts; econometrics; sampling methods; fixed-length sampling; gamma failure model; nonnormally distributed data; variable sampling interval; x-bar control chart economic design; Control charts; Costs; Failure analysis; Hydrogen; Information management; Manufacturing processes; Power generation economics; Process control; Sampling methods; Technology management; Economic design; fixed-length sampling; non-normal; variable sampling interval;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2629-4
  • Electronic_ISBN
    978-1-4244-2630-0
  • Type

    conf

  • DOI
    10.1109/IEEM.2008.4737869
  • Filename
    4737869