DocumentCode
2222450
Title
Second harmonic spectroscopy of two-dimensional Si nanocrystal layers
Author
Jiang, Yizhang ; Downer, M.C.
Author_Institution
Dept. of Phys., Texas Univ., Austin, TX, USA
fYear
2002
fDate
19-24 May 2002
Firstpage
36
Lastpage
37
Abstract
Summary form only given. We report new measurements of SHG in reflection from two-dimensional (2D) layers of Si nanocrystals embedded in the ultrathin (<10 nm) oxide of a Si[001] wafer by a chemical vapor deposition process.
Keywords
elemental semiconductors; interface states; nanoparticles; optical harmonic generation; photoluminescence; silicon; SHG in reflection; Si-SiO/sub 2/; azimuthal sample orientation; chirp-dependence; interface electronic structure; interface states; laser-driven charge transfer; photoluminescence; polarisation configuration; second harmonic spectroscopy; time-dependent SHG; two-dimensional nanocrystal layers; ultrathin oxide embedded layers; Interface phenomena; Optical frequency conversion; Photoluminescence; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location
Long Beach, CA, USA
Print_ISBN
1-55752-708-3
Type
conf
DOI
10.1109/QELS.2002.1031055
Filename
1031055
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