DocumentCode
2222485
Title
Superconducting Microbridge Junctions Fabricated using Focused Ion Beams
Author
Tettamanzi, G.C. ; Pakes, C.I. ; Potenza, A. ; Marrows, C.H. ; Prawer, S. ; Jamieson, D.N.
Author_Institution
Sch. of Phys., Melbourne Univ., Victoria, Vic.
fYear
2006
fDate
3-7 July 2006
Abstract
Sub-micron superconducting electronic devices may play a role in the realisation of proposed architectures for quantum computing and metrology. Further miniaturisation of superconducting electronics relies on the ability to fabricate the basic building block, the Josephson junction, on the scale of the superconducting coherence length, with sufficient accuracy that the junction characteristics may be controlled. Making use of focused ion beam technology to fabricate thin-film Nb microbridge devices, we examine the evolution of device characteristics with dimension, focusing on control of the critical current and suppression of superconductivity due to phase-slip behaviour.
Keywords
SQUIDs; focused ion beam technology; niobium; superconducting thin films; DC SQUID; Josephson junction; Nb; focused ion beam technology; phase-slip behaviour; quantum computing; submicron superconducting electronic devices; superconducting coherence length; superconducting microbridge junctions; superconductivity suppression; thin-film microbridge devices; Computer architecture; Critical current; Ion beams; Josephson junctions; Metrology; Niobium; Quantum computing; Superconducting devices; Superconducting thin films; Thin film devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoscience and Nanotechnology, 2006. ICONN '06. International Conference on
Conference_Location
Brisbane, Qld.
Print_ISBN
1-4244-0452-5
Electronic_ISBN
1-4244-0452-5
Type
conf
DOI
10.1109/ICONN.2006.340625
Filename
4143405
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