• DocumentCode
    2222497
  • Title

    Characterization of conducted noise generation for Sepic, Cuk and Boost converters working as power factor preregulators

  • Author

    Reis, F. S Dos ; Sebastian, J. ; Uceda, J.

  • fYear
    1993
  • fDate
    15-19 Nov 1993
  • Firstpage
    965
  • Abstract
    The influence of the electromagnetic interference in the electronic design is becoming more and more important. The current and future regulations limit the generation of conducted and radiated noise. These regulations also limit the minimum power factor for the equipment connected to the AC line. All these facts show the importance of the analysis of power converters working as power factor preregulators (PFP). In this paper the authors present a characterization of conducted noise generated by Sepic and Cuk converters as PFP in the discontinuous conduction mode (DCM). A comparison of conducted noise generated between Sepic and Cuk converters as PFP in DCM, and a Boost converter as PFP in continuous conduction mode (CCM) and DCM is made. The results show that the conducted noise generated by Sepic and Cuk converters in DCM is lower than the conducted noise generated by the Boost converter in DCM and CCM, for the same input inductor. This fact has important influence in the selection of the optimum topology for PFP
  • Keywords
    electromagnetic interference; power convertors; power factor correction; Boost converters; Cuk converters; Sepic converters; conducted noise; conducted noise generation; continuous conduction mode; discontinuous conduction mode; electromagnetic interference; electronic design; power factor preregulators; radiated noise; Character generation; Electromagnetic interference; Electronics industry; FCC; Harmonic analysis; Inductors; Noise generators; Power generation; Reactive power; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control, and Instrumentation, 1993. Proceedings of the IECON '93., International Conference on
  • Conference_Location
    Maui, HI
  • Print_ISBN
    0-7803-0891-3
  • Type

    conf

  • DOI
    10.1109/IECON.1993.339144
  • Filename
    339144