• DocumentCode
    2222523
  • Title

    Measurement of color invariants

  • Author

    Geusebroek, Jan-Mark ; Smeulders, Arnold W M ; Van Den Boomgaard, Rein

  • Author_Institution
    Intelligent Sensory Inf. Syst., Amsterdam Univ., Netherlands
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    50
  • Abstract
    This paper presents the measurement of object reflectance from color images. We exploit the Gaussian scale-space paradigm to define framework for the robust measurement of object reflectance from color images. Illumination and geometrical invariant properties are derived from a physical reflectance model based on the Kubelka-Munk theory. Imaging conditions are assumed to be white illumination and matte, dull object or general object, respectively. Invariance is denoted by +, whereas sensitivity to the imaging condition is indicated by -. Invariance, discriminative power and localization accuracy of the color invariants is extensively investigated, showing the invariants to be successful in discounting shadow, illumination intensity, highlights, and noise. Experiments show the different invariants to be highly discriminative while maintaining invariance properties. The presented framework for color measurement is well-founded in physics as well as measurement science. The framework is thoroughly evaluated experimentally. Hence is considered more adequate than existing methods for the measurement of invariant color features
  • Keywords
    image colour analysis; image processing; Gaussian scale-space paradigm; Kubelka-Munk theory imaging conditions; color images; color invariants measurement; geometrical invariant properties; illumination intensity; imaging condition; object reflectance; physical reflectance model; robust measurement; shadow; Apertures; Color; Colored noise; Electrical capacitance tomography; Geometry; Image segmentation; Intelligent systems; Lighting; Power measurement; Reflectivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on
  • Conference_Location
    Hilton Head Island, SC
  • ISSN
    1063-6919
  • Print_ISBN
    0-7695-0662-3
  • Type

    conf

  • DOI
    10.1109/CVPR.2000.855798
  • Filename
    855798