Title :
Software for measurement automation, deembedding and small-signal FET model extraction
Author :
Dobush, I.M. ; Stepacheva, A.V. ; Salnikov, A.S. ; Kokolov, A.A. ; Samuilov, A.A. ; Babak, L.I.
Author_Institution :
Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
Abstract :
Software programs for on-wafer measurement automation of multibias S-parameters, deembedding, and extraction of MESFET and HEMT small signal models is developed. The programs are included into software system INDESYS-MS that is integrated with on-wafer measurement setup.
Keywords :
S-parameters; Schottky gate field effect transistors; computerised instrumentation; electronic engineering computing; high electron mobility transistors; HEMT small signal model; INDESYS-MS software system; MESFET small signal model; multibias S-parameter; on-wafer measurement automation software program; Automation; HEMTs; MESFETs; Scattering parameters; Software measurement; Software systems;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-0883-1
