• DocumentCode
    2223139
  • Title

    New investigation on pseudospark discharge and quenching phenomenon at zero current

  • Author

    Bauville, G. ; Bendiab, F. ; Meslem, Y. ; Delmas, A.

  • Author_Institution
    Lab. de Phys. des Gaz et des Plasmas, Univ. de Paris-Sud, Orsay, France
  • Volume
    2
  • fYear
    1996
  • fDate
    21-26 Jul 1996
  • Firstpage
    991
  • Abstract
    These studies, carried out on the pseudospark discharge, show its high ability to open a circuit at zero current. The interesting results are linked to the diffuse discharge mode, and allow avoidance of the development of anodic spots at high peak current above 40 kA. In these experiments, after a pulse current of 18 kA and 225 μs duration, the rate of reapplied voltage is 18 kV/μs and the peak of withstand voltage is 18 kV. This ability depends strongly on the electrode conditioning. The authors obtained the best results with a number of shots up to 200 and a rate current lower than 2108 A/s. They believe that the values of the rate of current at zero current (conduction phase) have a great influence on the opening switch performance. They investigate other characteristics, such as the dimensions of the cavities, the hole diameter, the gap and the pressure, in order to increase performance. A CCD camera allows investigation of the conduction phase and the recovery phase before and after zero current crossing
  • Keywords
    electric breakdown; electrodes; spark gaps; sparks; switchgear testing; vacuum breakdown; vacuum interrupters; 18 kA; 18 kV; 225 mus; CCD camera; cavity dimensions; conduction phase; diffuse discharge mode; electrode conditioning; gap; hole diameter; opening switch performance; pressure; pseudospark discharge; pulse current; quenching phenomenon; recovery phase; withstand voltage; zero current crossing; Charge coupled devices; Charge-coupled image sensors; Circuit testing; Delay; Electrodes; Plasmas; Pulse circuits; Switched capacitor circuits; Switches; Zero voltage switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7803-2906-6
  • Type

    conf

  • DOI
    10.1109/DEIV.1996.545514
  • Filename
    545514