DocumentCode :
2223541
Title :
Finite-element analysis of platinum-based cone microelectrodes for implantable neural recording
Author :
Zarifi, Mohammad H. ; Frounchi, Javad ; Jahed, Navid M S ; Tinati, Mohammad A.
Author_Institution :
Microelectron. & Microsensor Res. Lab., Univ. of Tabriz, Tabriz, Iran
fYear :
2009
fDate :
April 29 2009-May 2 2009
Firstpage :
395
Lastpage :
398
Abstract :
There have been significant advances in fabrication of high-density microelectrode arrays using silicon micromachining technology in neural signal recording systems. The interface between microelectrodes and chemical environment brings great interest to researchers working on extracellular stimulation. This interface is quite complex and must be modeled carefully to match experimental results. Computer simulation is a method to increase the knowledge about these arrays and to this end the finite element method provides a strong environment for investigation of relative changes of the electrical field extension surrounding an electrode positioned in chemical environment. In this paper FEM simulation environment is used for modeling the metal-chemical interface, which is helpful for circuit designers to design front-end electronics more efficiently and reliable.
Keywords :
arrays; bioMEMS; bioelectric phenomena; biomedical electrodes; biomedical measurement; cellular biophysics; elemental semiconductors; finite element analysis; microelectrodes; neurophysiology; platinum; silicon; Pt; Si; chemical environment; electrical field extension; extracellular stimulation; finite-element analysis; front-end electronics design; high-density microelectrode array; implantable neural recording; metal-chemical interface; platinum-based cone microelectrode; silicon micromachining technology; Chemical technology; Computational modeling; Computer simulation; Electrodes; Extracellular; Fabrication; Finite element methods; Microelectrodes; Micromachining; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Engineering, 2009. NER '09. 4th International IEEE/EMBS Conference on
Conference_Location :
Antalya
Print_ISBN :
978-1-4244-2072-8
Electronic_ISBN :
978-1-4244-2073-5
Type :
conf
DOI :
10.1109/NER.2009.5109316
Filename :
5109316
Link To Document :
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