DocumentCode
2223849
Title
Optimal software release policy with change-point
Author
Inoue, Shinji ; Yamada, Shigeru
Author_Institution
Grad. Sch. of Eng., Tottori Univ., Japan
fYear
2008
fDate
8-11 Dec. 2008
Firstpage
531
Lastpage
535
Abstract
Testing-time when a characteristic of a software failure-occurrence or fault-detection phenomenon is notably changed is ordinarily called change-point. The effect of the change-point on software reliability growth process influences on accuracy of the software reliability assessment based on SRGMs which are mostly developed under the assumption that the stochastic characteristic of the software failure-occurrence or the fault-detection phenomenon does not change throughout the testing. In this paper, we discuss a framework for software reliability growth modeling with change-point as one of the solutions to incorporate the effect of the change-point into software reliability assessment, and also discuss its application to an optimal software release problem with change-point. That is one of the interesting issues for project management of software development. Finally, we show numerical examples of our model and derived software release policy by using actual data.
Keywords
project management; software reliability; stochastic processes; project management; software development; software failure-occurrence; software fault-detection; software release policy; software release problem; software reliability assessment; software reliability growth process; Application software; Fault detection; Hazards; Parameter estimation; Programming; Project management; Resource management; Software reliability; Software testing; Stochastic processes; Change-Point; Modeling Framework; Nonhomogeneous Poisson Process; Optimal Software Release Problem; Software Reliability Growth Model;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4244-2629-4
Electronic_ISBN
978-1-4244-2630-0
Type
conf
DOI
10.1109/IEEM.2008.4737925
Filename
4737925
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